| 1 | Fevzi Belli and Christof J. Budnik and Axel Hollmann and Tugkan Tuglular and W. Eric Wong
Model-based mutation testing - Approach and case studies
Sci. Comput. Program., 120(), 2016. |
|
| | Abstract: Available soon... |
| | @ARTICLE{BelliBHTW16,
author = {Fevzi Belli and Christof J. Budnik and Axel Hollmann and Tugkan Tuglular and W. Eric Wong},
title = {Model-based mutation testing - Approach and case studies},
journal = {Sci. Comput. Program.},
year = {2016},
month = {},
volume = {120},
number = {},
pages = {25--48}
} |
| 2 | Vidroha Debroy and W. Eric Wong
Combining mutation and fault localization for automated program debugging
Journal of Systems and Software, 90(), 2014. |
|
| | Abstract: Available soon... |
| | @ARTICLE{DebroyW14,
author = {Vidroha Debroy and W. Eric Wong},
title = {Combining mutation and fault localization for automated program debugging},
journal = {Journal of Systems and Software},
year = {2014},
month = {},
volume = {90},
number = {},
pages = {45--60}
} |
| 3 | Vidroha Debroy and W. Eric Wong
Using Mutation to Automatically Suggest Fixes for Faulty Programs
Proceedings of the 3rd International Conference on Software Testing Verification and Validation (ICST'10)Paris, France, 6 April 2010. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{DebroyW10,
author = {Vidroha Debroy and W. Eric Wong},
title = {Using Mutation to Automatically Suggest Fixes for Faulty Programs},
booktitle = {Proceedings of the 3rd International Conference on Software Testing Verification and Validation (ICST'10)},
year = {2010},
address = {Paris, France},
month = {6 April},
pages = {}
} |
| 4 | Vidroha Debroy and W. Eric Wong
Using Mutation to Automatically Suggest Fixes for Faulty Programs
Third International Conference on Software Testing, Verification and Validation, {ICST} 2010, Paris, France, April 7-9, 2010, 2010. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{DebroyW10,
author = {Vidroha Debroy and W. Eric Wong},
title = {Using Mutation to Automatically Suggest Fixes for Faulty Programs},
booktitle = {Third International Conference on Software Testing, Verification and Validation, {ICST} 2010, Paris, France, April 7-9, 2010},
year = {2010},
address = {},
month = {},
pages = {65--74}
} |
| 5 | Fevzi Belli and Christof J. Budnik and W. Eric Wong
Basic Operations for Generating Behavioral Mutants
Proceedings of the 2nd Workshop on Mutation Analysis (MUTATION'06)Raleigh, North Carolina, 2006. |
|
| | Abstract: This paper attempts to subsume the existing great variety of mutation operations to two basic operations, insertion and omission and their combinations. These basic operations are applied to different elements of graph-based models of increasing representation power. A case study applies the approach to these models for generating mutants of different features and compares the fault detection capacity of the mutants generated. |
| | @INPROCEEDINGS{BelliBW06,
author = {Fevzi Belli and Christof J. Budnik and W. Eric Wong},
title = {Basic Operations for Generating Behavioral Mutants},
booktitle = {Proceedings of the 2nd Workshop on Mutation Analysis (MUTATION'06)},
year = {2006},
address = {Raleigh, North Carolina},
month = {},
pages = {9}
} |
| 6 | Tatiana Sugeta and Jose Carlos Maldonado and W. Eric Wong
Mutation Testing Applied to Validate SDL Specifications
Proceedings of the 16th IFIP International Conference on Testing of Communicating SystemsOxford, UK, 17-19 March 2004. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{SugetaMW04,
author = {Tatiana Sugeta and Jose Carlos Maldonado and W. Eric Wong},
title = {Mutation Testing Applied to Validate SDL Specifications},
booktitle = {Proceedings of the 16th IFIP International Conference on Testing of Communicating Systems},
year = {2004},
address = {Oxford, UK},
month = {17-19 March},
pages = {2741}
} |
| 7 | P. Vilela and M. Machado and W. Eric Wong
Testing for Security Vulnerabilities in Software
Software Engineering and Applications, 2002. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{VilelaMW02,
author = {P. Vilela and M. Machado and W. Eric Wong},
title = {Testing for Security Vulnerabilities in Software},
booktitle = {Software Engineering and Applications},
year = {2002},
address = {},
month = {},
pages = {}
} |
| 8 | Mei{-}Hwa Chen and Michael R. Lyu and W. Eric Wong
Effect of code coverage on software reliability measurement
{IEEE} Trans. Reliability, 50(2), 2001. |
|
| | Abstract: Available soon... |
| | @ARTICLE{ChenLW01,
author = {Mei{-}Hwa Chen and Michael R. Lyu and W. Eric Wong},
title = {Effect of code coverage on software reliability measurement},
journal = {{IEEE} Trans. Reliability},
year = {2001},
month = {},
volume = {50},
number = {2},
pages = {165--170}
} |
| 9 | W. Eric Wong and Joseph R. Horgan and Aditya P. Mathur and Alberto Pasquini
Test Set Size Minimization and Fault Detection Effectiveness: A Case Study in a Space Application
Journal of Systems and Software, 48(2), October 1999. |
|
| | Abstract: An important question in software testing is whether it is reasonable to apply coverage-based criteria as a filter to reduce the size of a test set. An empirical study was conducted using a test set minimization technique to explore the effect of reducing the size of a test set, while keeping block coverage constant, on the fault detection strength of the resulting minimized test set. Two types of test sets were examined. For those with respect to a fixed size, no test case screening was conducted during the generation, whereas for those with respect to a fixed coverage, each subsequent test case had to improve the overall coverage in order to be included. The study reveals that regardless of how a test set is generated, with or without any test case screening, block minimized test sets have a size/effectiveness advantage, in terms of a significant reduction in test set size and with almost the same fault detection effectiveness, over the original non-minimized test sets. |
| | @ARTICLE{WongHMP99,
author = {W. Eric Wong and Joseph R. Horgan and Aditya P. Mathur and Alberto Pasquini},
title = {Test Set Size Minimization and Fault Detection Effectiveness: A Case Study in a Space Application},
journal = {Journal of Systems and Software},
year = {1999},
month = {October},
volume = {48},
number = {2},
pages = {79-89}
} |
| 10 | W. Eric Wong and Joseph R. Horgan and Saul London and Aditya P. Mathur
Effect of Test Set Minimization on Fault Detection Effectiveness
Software:Practice and Experience, 28(), 1998. |
|
| | Abstract: Available soon... |
| | @ARTICLE{WongHLM98,
author = {W. Eric Wong and Joseph R. Horgan and Saul London and Aditya P. Mathur},
title = {Effect of Test Set Minimization on Fault Detection Effectiveness},
journal = {Software:Practice and Experience},
year = {1998},
month = {},
volume = {28},
number = {},
pages = {347–369}
} |
| 11 | Sandra Camargo Pinto Ferraz Fabbri and Jose Carlos Maldonado and Paulo Cesar Masiero and Marcio Eduardo Delamaro and W. Eric Wong
Mutation Testing Applied to Validate Specifications Based on Petri Nets
Proceedings of the IFIP TC6 8th International Conference on Formal Description Techniques VIII, 1995. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{FabbriMMDW95,
author = {Sandra Camargo Pinto Ferraz Fabbri and Jose Carlos Maldonado and Paulo Cesar Masiero and Marcio Eduardo Delamaro and W. Eric Wong},
title = {Mutation Testing Applied to Validate Specifications Based on Petri Nets},
booktitle = {Proceedings of the IFIP TC6 8th International Conference on Formal Description Techniques VIII},
year = {1995},
address = {},
month = {},
pages = {329-337}
} |
| 12 | W. Eric Wong and Aditya P. Mathur
Reducing the Cost of Mutation Testing: An Empirical Study
Journal of Systems and Software, 31(3), December 1995. |
|
| | Abstract: Amongst the various testing strategies, mutation testing has been empirically found to be the most effective in detecting faults. However, mutation often imposes unacceptable demands on computing and human resources due to the large number of mutants that need to be compiled and executed on one or more test cases. In addition, the tester needs to examine many mutants and analyze these for possible equivalence with the program under test. For these reasons, mutation is generally regarded by the practicing test engineer as too expensive to use. As one significant component of the cost of mutation is the execution of mutants against test cases, we believe that the cost can be reduced dramatically by reducing the number of mutants that need to be examined. We report the results from a case study designed to investigate two alternatives to reduce the cost of mutation. The alternatives considered are: (1) the randomly selected x'% mutation, and (2) the constrained mutation. We provide experimental data indicating that both alternatives lead to test sets that distinguish a significant number of all mutants and provide high all-uses coverage. |
| | @ARTICLE{WongM95,
author = {W. Eric Wong and Aditya P. Mathur},
title = {Reducing the Cost of Mutation Testing: An Empirical Study},
journal = {Journal of Systems and Software},
year = {1995},
month = {December},
volume = {31},
number = {3},
pages = {185-196}
} |
| 13 | Richard A. DeMillo and Aditya P. Mathur and W. Eric Wong
Some Critical Remarks on a Hierarchy of Fault-Detecting Abilities of Test Methods
IEEE Transactions of Software Engineering, 21(10), October 1995. |
|
| | Abstract: Available soon... |
| | @ARTICLE{DeMilloMW95,
author = {Richard A. DeMillo and Aditya P. Mathur and W. Eric Wong},
title = {Some Critical Remarks on a Hierarchy of Fault-Detecting Abilities of Test Methods},
journal = {IEEE Transactions of Software Engineering},
year = {1995},
month = {October},
volume = {21},
number = {10},
pages = {858-862}
} |
| 14 | W. Eric Wong and Joseph R. Horgan and Saul London and Aditya P. Mathur
Effect of Test Set Minimization on Fault Detection Effectiveness
Proceedings of the 17th International Conference on Software Engineering (ICSE '95)Seattle, Washington, 23-30 April 1995. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{WongHLM95,
author = {W. Eric Wong and Joseph R. Horgan and Saul London and Aditya P. Mathur},
title = {Effect of Test Set Minimization on Fault Detection Effectiveness},
booktitle = {Proceedings of the 17th International Conference on Software Engineering (ICSE '95)},
year = {1995},
address = {Seattle, Washington},
month = {23-30 April},
pages = {41-50}
} |
| 15 | W. Eric Wong and Aditya P. Mathur
Fault Detection Effectiveness of Mutation and Data Flow Testing
Software Quality Journal, 4(1), March 1995. |
|
| | Abstract: We report results from an experiment to compare the fault detection effectiveness of mutation, its variants and the all-uses data flow criteria. Adequate test sets were generated randomly, as opposed to by human testers as in some previous studies. We view our results in the light of those from earlier studies comparing mutation with path-oriented testing strategies. We identify and discuss factors that one might consider while evaluating an adequacy criterion for use in practice. Results from our experiments strengthen a hypothesis that an adequacy criterion based on one of the two variants of mutation has superior fault detection effectiveness than that of the all-uses criterion. |
| | @ARTICLE{WongM95a,
author = {W. Eric Wong and Aditya P. Mathur},
title = {Fault Detection Effectiveness of Mutation and Data Flow Testing},
journal = {Software Quality Journal},
year = {1995},
month = {March},
volume = {4},
number = {1},
pages = {69-83}
} |
| 16 | Aditya P. Mathur and W. Eric Wong
A Theoretical Comparison Between Mutation and Data Flow Based Test Adequacy Criteria
Proceedings of the 22nd annual ACM Computer Science Conference on Scaling UpPhoenix, Arizona, 1994. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{MathurW94a,
author = {Aditya P. Mathur and W. Eric Wong},
title = {A Theoretical Comparison Between Mutation and Data Flow Based Test Adequacy Criteria},
booktitle = {Proceedings of the 22nd annual ACM Computer Science Conference on Scaling Up},
year = {1994},
address = {Phoenix, Arizona},
month = {},
pages = {38-45}
} |
| 17 | W. Eric Wong and Joseph R. Horgan and Saul London and Aditya P. Mathur and Md Joseph and R. Horgan
Effect of Test Set Size and Block Coverage on the Fault Detection Effectiveness
Proceedings of the 5th International Symposium on Software Reliability EngineeringMonterey, California, 6-9 November 1994. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{WongHLMJH94,
author = {W. Eric Wong and Joseph R. Horgan and Saul London and Aditya P. Mathur and Md Joseph and R. Horgan},
title = {Effect of Test Set Size and Block Coverage on the Fault Detection Effectiveness},
booktitle = {Proceedings of the 5th International Symposium on Software Reliability Engineering},
year = {1994},
address = {Monterey, California},
month = {6-9 November},
pages = {230-238}
} |
| 18 | Aditya P. Mathur and W. Eric Wong
An Empirical Comparison of Data Flow and Mutation-based Test Adequacy Criteria
Software Testing, Verification and Reliability, 4(1), 1994. |
|
| | Abstract: Evaluation of the adequacy of a test set consisting of one or more test cases is a problem oftes encountered in software testing environments. Two test adequacy criiteria are considered, namely the data flow based all-uses criterion and a mutation based criterion. An empirical study was conducted to compare the difficulty of satisfying the two criteria and their costs. Similar studies conducted in the past are discussed in the light of this study. A discussion is also presented of how and why the results of this study, when viewed in conjunction with the results of earlier comparisons of testing methods, are useful to a software test team. |
| | @ARTICLE{MathurW94,
author = {Aditya P. Mathur and W. Eric Wong},
title = {An Empirical Comparison of Data Flow and Mutation-based Test Adequacy Criteria},
journal = {Software Testing, Verification and Reliability},
year = {1994},
month = {},
volume = {4},
number = {1},
pages = {9 - 31}
} |
| 19 | W. Eric Wong and Marcio Eduardo Delamaro and Jose Carlos Maldonado and Aditya P. Mathur
Constrained Mutation in C Programs
Proceedings of the 8th Brazilian Symposium on Software EngneeringCuritiba, Brazil, October 1994. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{WongDMM94,
author = {W. Eric Wong and Marcio Eduardo Delamaro and Jose Carlos Maldonado and Aditya P. Mathur},
title = {Constrained Mutation in C Programs},
booktitle = {Proceedings of the 8th Brazilian Symposium on Software Engneering},
year = {1994},
address = {Curitiba, Brazil},
month = {October},
pages = {439-452}
} |
| 20 | W. Eric Wong
On Mutation and Data Flow
Purdue University, West Lafayette, Indiana, 1993.Unknown- |
|
| | Abstract: Available soon... |
| | @PHDTHESIS{Wong93,
author = {W. Eric Wong},
title = {On Mutation and Data Flow},
school = {Purdue University},
year = {1993},
type = {phdthesis},
address = {West Lafayette, Indiana},
month = {},
} |
| 21 | W. Eric Wong and Aditya P. Mathur
Reducing the Cost of Mutation Testing: An Empirical Study
Purdue University, West Lafayette, Indiana, 1993. |
|
| | Abstract: Available soon... |
| | @TECHREPORT{WongM93,
author = {W. Eric Wong and Aditya P. Mathur},
title = {Reducing the Cost of Mutation Testing: An Empirical Study},
institution = {Purdue University},
year = {1993},
type = {techreport},
number = {},
address = {West Lafayette, Indiana},
month = {},
} |
| 22 | Aditya P. Mathur and W. Eric Wong
An Empirical Comparison of Mutation and Data Flow Based Test Adequacy Criteria
Purdue University, West Lafayette, Indiana, 1993. |
|
| | Abstract: Available soon... |
| | @TECHREPORT{MathurW93,
author = {Aditya P. Mathur and W. Eric Wong},
title = {An Empirical Comparison of Mutation and Data Flow Based Test Adequacy Criteria},
institution = {Purdue University},
year = {1993},
type = {techreport},
number = {},
address = {West Lafayette, Indiana},
month = {},
} |
